Module II

 

II. Nanotools for surface analysis and modifications

2.1 Micro & Nanoanalysis I: Imaging techniques
2.2 Micro & Nanoanalysis II: Chemical composition and mapping
2.3 Nanotools for surface structuring I: X-ray, Electron and Ion beam systems
2.4 Nanotools for surface structuring II: Research and Industrial Trends
2.5 Real Space Imaging at the Nanoscale I: Scanning Tunneling microscopy and scanning near field optical microscopy
2.6 Real Space Imaging at the Nanoscale II: Atomic Force Microscopy

 

Module Description

This module presents an introduction into exciting research topics: theory and practice on modern analytical techniques at the micro- and nanometer scale. The students will learn the surface analysis and structuring, based on electron, ion, x-ray and atomic force technologies. The student will get the important knowledge concerning the advantages and the limits of different techniques for practical applications, depth understanding of their instrumental aspects, ability to recognize artefacts and strategies to overcome them. More then 50% of the time is devoted to practical work (the participants from industries and research laboratories are welcome to discuss their problems related to analysis and surface structuring). The students will learn carry out the measurements and basic data analysis. The students will use their gained knowledge directly in collaborative online experiments in a computer laboratory.

 

Aims

To get the basics of modern techniques for surface analysis and structuring at micro and nanoscale, to understand the different criteria to make correct choice in analytical tools to solve concrete problems, taking into account advantages and limits of different techniques, the new functionalities related to nanoscale and the working principles of the given techniques. The student will be able to carry out the measurements and basic data analysis.